Selected Area Electron Diffraction (SAED) SAED is a technique used in transmission electron microscopy (TEM) to obtain diffraction patterns from specific regions of a sample. A selected area aperture ...

In this example, precession-assisted 4D-STEM was used to map different phases and reveal individual grains at the nanoscale, based on their crystal lattice orientation, which the conventional ...

A second major asset of XRD-CT is the possibility to carry out a reverse analysis to extract a posteriori the scattering/diffraction pattern from a selected area of the tomography image. Therefore ...