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Selected Area Electron Diffraction (SAED) SAED is a technique used in transmission electron microscopy (TEM) to obtain diffraction patterns from specific regions of a sample. A selected area aperture ...
Enhancing Material Characterization with Advanced 4D-STEM Workflows Using Beam Precession - AZoM.com
In this example, precession-assisted 4D-STEM was used to map different phases and reveal individual grains at the nanoscale, based on their crystal lattice orientation, which the conventional ...
A second major asset of XRD-CT is the possibility to carry out a reverse analysis to extract a posteriori the scattering/diffraction pattern from a selected area of the tomography image. Therefore ...
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