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IEEE2d
Study on Supercritical Fluid Technique for Application in Nonvolatile Resistive Random Access Memory (RRAM) Device Using SBT Ferroelectric Thin Films - IEEE Xplore
In recent years, the resistive random access memory (RRAM) device was attracted great attention. The RRAM device was composed of the metal/insulation layer/metal (MIM) structure. Because of its simple ...
IEEE4d
Measurement of Static Random Access Memory Power-Up State Using an Addressable Cell Array Test Structure - IEEE Xplore
The data stored in a static random access memory (SRAM) immediately after power-up is of practical interest for some applications, such as SRAM physical unclonable functions. In this paper, ...