Semiconductor wafer defect pattern recognition and classification is a crucial area of research that underpins yield enhancement and quality assurance in microelectronics manufacturing.

References [1] Complete, fully-automatic extraction, classification and image registration of repeating printed fabric patterns and their derivatives. Expert Systems with Applications (2023). [2 ...

AI is shedding new light on the 12,000-year conversation between cats and their humans, suggesting that house cats wield a ...

Dr Chen has published (edited and authored) 30 books in his areas of research, including a number of books published by World Scientific Publishing. He was Associate Editor for International Journal ...

Predictive analytics, pattern recognition, and classification problems are not new. Long used in the financial services and insurance industries, predictive analytics is about using statistics, data ...

Starting with the era of learning machines, reasons are presented for the current emergence of graphics-oriented interactive pattern analysis and classification systems (IPACS) as a general approach ...

This book is currently the only one on this subject containing both introductory material and advanced recent research results. It presents, at one end, fundamental concepts and notations developed in ...

In EMG based pattern recognition (EMG-PR), deep learning-based techniques have become more prominent for their self-regulating capability to extract discriminant features from large data-sets.

This unassuming treasure chest in Logan, Ohio, houses artifacts spanning centuries, creating a time-travel experience without the pesky paradoxes or need for a flux capacitor. Every aisle tells ...

The DSM still dominates mental health, but it’s time to evolve. Dr. Steven Rondeau reveals how qEEG brain mapping offers a ...

While other shoppers drain their accounts on overpriced retail, savvy Minnesotans quietly fill their vehicles with incredible ...

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