Semiconductor wafer defect pattern recognition and classification is a crucial area of research that underpins yield enhancement and quality assurance in microelectronics manufacturing.

References [1] Complete, fully-automatic extraction, classification and image registration of repeating printed fabric patterns and their derivatives. Expert Systems with Applications (2023). [2 ...

ORLANDO — Capella Space is combining its space-based imagery with pattern recognition to more quickly detect and characterize vessels of interest. The company, which builds and manages synthetic ...