This study presents a non-destructive technique for PN junction depth measurement in silicon wafers, utilizing terahertz ...

Abstract: The origin of the p-n junction isolation technique is clarified, and certain allegations in a recent article by Kilby are repudiated. Published in: IEEE Transactions on Electron Devices ( ...

Abstract: The chaotic dynamics of the R-L-diode circuit are studied. The boundary transformation is introduced rigorously and its singularities are shown. Itineraries for symbolic dynamics are defined ...