A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.

Dynamic Image Analysis (DIA) has become a widely used method for the routine analysis of the size and shape of particles within numerous industries.

Analyzing failures in printed circuit boards (PCBs) is critical to ensure the functionality and reliability of electronic devices. A synopsis of the methods and techniques utilized in PCB failure ...

SPICE (Simulation Program with Integrated Circuits Emphasis, often written as Spice) environment becomes an analysis platform of many design software package today, digital and analog alike. Any ...

The Sixth Circuit panel of Judges Boggs, Griffin and Murphy unanimously rejected Calcutt's constitutional challenges to the FDIC's action, but split on the statutory claims.

Introduction to fundamental concepts and applications of electrical engineering. Topics include: circuit analysis from dc resistive networks to networks of impedances operating in the sinusoidal ...

This article proposes literary criticism as a source of insight into consumer behavior, presents a broad overview of literary criticism, provides a specific illustrative analysis, and offers ...

For example, in Kim, the Second Circuit determined all three of the employer’s counterclaims were based in fact and presented, at a minimum, a nonfrivolous argument for extending, modifying or ...