Kwak, Hyunsoo & Ryu, Sungyoon & Cho, Suil & Kim, Junmo & Yang, Yusin & Kim, Jungwon. (2021). Non-destructive thickness characterisation of 3D multilayer semiconductor devices using optical spectral ...

One of the shared, fundamental goals of most chemistry researchers is the need to predict a molecule's properties, such as ...

Multi-layer 3-dimensional (3D) vertical RRAM (VRRAM) PUF with in-cell stabilization scheme to improve both cost efficiency and reliability. The proposed PUF features excellent resistance against ...