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IEEE4d
Reduction of thermal induced pattern loading and device sensitivity by various rapid thermal processing models - IEEE Xplore
Beyond 65nm node, pattern loading effect (PLE) in conventional RTP (front-side heating) has been emerged as a major yield killer. Different pattern and deposited film property strongly influence ...
IEEE4d
Deep Learning-Based Short-Term Load Forecasting Approach in Smart Grid With Clustering and Consumption Pattern Recognition - IEEE Xplore
Different aggregation levels of the electric grid's big data can be helpful to develop highly accurate deep learning models for Short-term Load Forecasting (STLF) in electrical networks. Whilst ...