This letter presents an Embedded Current Sensing (ECS) method to address the critical challenges in Light-Current- Voltage (LIV) testing under nanosecond-pulsewidth and highpeak- power conditions. The ...

Synopsys High-Speed Test IO IP achieves higher data rates than other test IO, matching the advancement in testing equipment and supporting high-speed reliability testing with no protocol demands. The ...

Based on digital twins and plant models simulating in real-time, hardware-in-the-loop testing ensures ECUs perform flawlessly under real-world conditions.

This paper describes the content of a well-written analytical procedure for regulated high-performance liquid chromatography (HPLC) testing. A stability-indicating HPLC assay for a drug product ...

The Point of the Probe: Designing Circuit Boards for Test Learn about key strategies for testing a PCB design at the system and component level, including the effective deployment of test points.

System-level testing demand for advanced ICs has been rising. Foundries including TSMC, Intel and Samsung Electronics, as well as OSATs such as ASE Technology, are already involved, according to ...