Wafer mapping TXRF is used as a process optimization tool in metal etch, silicon nitride deposition and chemical mechanical polish.

Backed by a $2.7 million seed round, the startup is reimagining how intelligent agents can revolutionize high-stakes ...

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In-line metrology provides critical information for feedback and feedforward process control. In high-volume manufacturing, the fundamental question is: how fast, how frequent, and how accurate ...