News

Alternating current can reduce friction by redistributing electronic density at material interfaces
A research team led by Prof. Tian-Bao Ma from the Department of Mechanical Engineering at Tsinghua University has proposed a ...
IEEE18d
Direct Measurement of Three-Dimensional Forces in Atomic Force Microscopy
Direct measurement of three-dimensional (3-D) forces between an atomic force microscope (AFM) probe and the sample benefits diverse applications of AFM, including force spectroscopy, nanometrology, ...
frogheart.ca18d
All about Atomic Force Microscopy (AFM) with Gerd Binnig and Christoph ...
Gerd Binnig, Christoph Gerber, and Calvin Quate invented the atomic force microscope in the 1980s and an Aug. 16, 2016 news item on Nanotechnology Now announces a discussion with two of the inventors, ...
IEEE26d
Teleoperated 3-D Force Feedback From the Nanoscale With ... - IEEE Xplore
In this study, 3-D experimental teleoperated force feedback during contact with nanoscale surfaces is demonstrated using an atomic force microscope (AFM) on the slave side and a haptic device on the ...