In this paper, a new Radiation-Hardened-By-Design (RHBD) SRAM is proposed to mitigate the Single Event Upset (SEU) and Single Event Double Node Upset (SEDU). The Monte-Carlo analysis with 5000 ...

Due to semiconductor technology scaling, integrated circuits have become more sensitive to soft errors. To effectively tolerate multi-node-upsets caused by soft errors and reduce the power dissipation ...