Many application domains, spanning from computational photography to medical imaging, require recovery of high-fidelity images from noisy, incomplete or partial/compressed measurements.

Despite being widely used in everyday language, there is no clear consensus on how resilience should be defined or measured. Coming to grips with some of the contention.

Most wafer fab in semiconductor manufacturing industry adopt order delivery mode, and cycle time is the key index to measure whether orders can be delivered on time. In order to ensure the timely ...