Caltech scientists have found a fast and efficient way to add up large numbers of Feynman diagrams, the simple drawings ...

A new test generation technique for path delay faults in circuits employing scan/hold type flip-flops is presented. Reduced ordered binary decision diagrams (ROBDDs) are used to represent Boolean ...

Testing is an important area of software engineering. There are various types of testing methodologies followed in various stages of Software Development Life Cycle (SDLC). We are proposed a novel ...

Researchers have developed a method for assessing intrinsic capacity and age-related decline from a single drop of blood or saliva.