through interface traps results in a temperature dependence of the Tunnel FETs IV characteristics; (c) the impact of interface traps on I off is larger in Tunnel FETs than in MOSFETs; (d) interface ...

Chemistry Department, Rutgers University, 73 Warren Street, Newark, New Jersey 07102 Department of Electrical and Computer Engineering, Rutgers University, Piscataway, New Jersey 08854 Center of ...