Scientists use scanning tunneling microscopy to understand how a material's electronic or magnetic properties relate to its ...

Quantification of the noise content in the scanning electron microscope image is an important parameter in the signal-to-noise ratio. The most common type of noise in SEM image is the Gaussian noise.

We report on the structural analysis of graphene oxide (GO) by transmission electron microscopy (TEM). Electron diffraction shows that on average the underlying carbon lattice maintains the order and ...

Abstract Scanning electron microscopy (SEM) is of great significance for analyzing the ultrastructure. However, due to the requirements of data throughput and electron dose of biological samples in ...

Path following control of micrometer-sized tools is the key to improve automation capabilities at the small scales. This paper addresses the issue of path following control for piezoelectric inertia ...