The data stored in a static random access memory (SRAM) immediately after power-up is of practical interest for some applications, such as SRAM physical unclonable functions. In this paper, ...

During burn-in of DRAM (Dynamic Random Access Memory), power consumption has become a significant consideration on the capabilities of test environment with the growing quantity. Under burn-in test ...

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Reflections from a recent panel discussion at DAC, The Chips to Systems Conference held at Moscone West on the CHIPS Act's impact on the design ecosystem ...