This work presents a method for extracting higher order thermal models of GaN power high-electron mobility transistors (HEMTs) from I–V measurements using a typical commercial power analyzer. The ...

The introduction of electronic load for testing high-accurate low-voltage sources (solar cells) requires thorough reviewing not only the circuit construction, but also thermal and mechanical ...

What is CMOS 2.0? At its core, CMOS 2.0 is an effort to move beyond the limitations of a single monolithic die. Rather than ...