This study presents a non-destructive technique for PN junction depth measurement in silicon wafers, utilizing terahertz ...

We propose a 16T5C oxide thin-film transistor (TFT) micro light-emitting diode (μLED) pixel circuit that enables accurate low gray-level expression by employing a sweep generator (SG) that generates a ...

Abstract: This paper extends the earlier analysis by Kingston of the switching response of a uniform-base diode to a graded-base diode. It concerns the time required to switch a diode from a ...