Automated test equipment market is pivoting from speed-centric instruments toward cloud-anchored, AI-driven, mixed-signal platforms that handle 6G, EV and compound-semiconductor complexities while ...

To address the shortcomings of classical chaotic time series in image encryption algorithms in terms of low complexity, fewer control parameters, and limited range of value domains, this paper ...

In this article, we propose a novel machine-learning-based read reference voltage estimation framework for the NAND flash memory systems without the knowledge of retention time. To establish an ...