An embedded memory test solution will interact with this test bus ... physical location and class of each fault to determine the root cause. SoC complexity is increasing as are time-to-market ...

In light of predictions for dramatic growth rates for design complexity ... time-to-market. To be effective, new strategies need to inject test knowledge early in the design cycle. Along with more ...

adding complexity to the product-mix challenge. Wafer sort poses particular problems since the test needs of memory products are more diverse than at final test. Consequently, the question is how ...

Test complexity has grown with the adoption ... Keysight has achieved a significant milestone in enabling faster time to market for LPDDR6 memory designs.” ...

This testing can be applied at three distinct time periods ... effects of the nondestructive memory test on performance are further reduced by minimizing the complexity of the test algorithm ...