Abstract: Threshold voltage shift (ΔVT) due to Negative Bias Temperature Instability (NBTI) in p-MOSFETs is modeled using the BTI Analysis Tool (BAT) framework. The ΔV T time kinetics during and after ...

Caltech scientists have found a fast and efficient way to add up large numbers of Feynman diagrams, the simple drawings ...

The anodic bonding technology is a well-established industrial technique, which has been reported to account for the mainstream packaging methods in Micro-Electro-Mechanical-Systems (MEMS) devices, ...

RETURN TO ISSUE Viewpoint NEXT Cross-Flow Treatment of PFAS in Water: Materials Challenges and Potential Solutions Mallikarjuna N. Nadagouda* ...