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Scientists use scanning tunneling microscopy to understand how a material's electronic or magnetic properties relate to its ...
The recent research has revealed that the deformation caused by applied stress to a shape-memory alloy (SMA) generates a change in the electrical resistance caused by the superelasticity. We have also ...
ABLIC’s single-chip, battery-level sensor/display driver saves power and simplifies the design of cordless tools and other ...
Employing more stress testing at the wafer level improves quality while reducing burn-in time and cost. So why isn’t it ...
For the enhancement of Silicon Carbide (SiC) processes and reliability assessments, precise and comprehensive characterization of the structural and local electrical properties of semiconductor layers ...