Defects can show up in the clock trees that drive scan chains, and even inside blocks of scan cells, which may number in the millions. Jayant D’Souza, technical product director for yield learning ...

Reflections from a recent panel discussion at DAC, The Chips to Systems Conference held at Moscone West on the CHIPS Act's impact on the design ecosystem ...

In this paper, a review study and analysis of 1-bit full adder designs is presented with different logic styles such as Hybrid pass logic with static CMOS (HPSC), Hybrid and Hybrid-CMOS. Different ...

The authors present new pass-transistor logic which contains fewer transistors and has better performance than Hitachi's double pass-transistor logic (DPL). The new CMOS logic, dual value logic (DVL), ...