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What techniques do you use to confirm the defects are in the right place? Because the defect concentration is so low, we cannot use methods that are typically used to characterise materials, such as X ...
Defect Engineering in Silver-Based Bimetallic Semiconductors: Recent Advances and Future Perspective
You are free to share (copy and redistribute) this article in any medium or format and to adapt (remix, transform, and build upon) the material for any purpose, even commercially within the parameters ...
You are free to share (copy and redistribute) this article in any medium or format and to adapt (remix, transform, and build upon) the material for any purpose, even commercially within the parameters ...
By adopting the drag-type staged fracturing process with double-packers and a single-slip, and combining it with methods such as the analysis of pump injection stress curve stages, gas extraction ...
Absorber Layer,Absorption Region,Ball Milling Process,Ball-milled Powder,Band Gap Of The Samples,Buffer Layer,Carbon Monoxide,Carrier Concentration,Cd Concentration,Charge Carriers,Conversion ...
Persistent Link: https://ieeexplore.ieee.org/servlet/opac?punumber=5503869 ...
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