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IEEE4d
Link-Layer Capacity of NOMA Under Statistical Delay QoS Guarantees - IEEE Xplore
In this paper, we study the achievable link-layer rate, namely, effective capacity (EC), under the per-user statistical delay quality-of-service (QoS) requirements, for a downlink non-orthogonal ...
EE World Online6d
Oscilloscope software automates automotive ASA-ML serial link tests
QPHY2-ASA software from Teledyne LeCroy lets you perform physical-layer tests on ASA-ML v1.1 devices. SerDes devices transfer ...
IEEE6d
DRAM Data Retention and Cell Transistor Threshold Voltage Reliability Improved by Passivation Annealing Prior to the Deposition of Plasma Nitride Layer - IEEE Xplore
We report, for the first time, that the fail bit counts of dynamic random access memory (DRAM) reduced by 18% and the yield loss after packaging induced by data retention degradation decreased by 1.16 ...