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The total ionizing dose (TID) radiation response of a flash memory circuit including high voltage (HV) periphery was studied. We show that functional failure of the charge pumps (CP) is mostly caused ...

Researchers have uncovered how losing the autism-linked gene PTEN in a specific set of inhibitory neurons reshapes brain circuits tied to fear and anxiety.

The operating principle of the clamp circuits like clamping diodes and flying capacitor in three-level LLC converter is different from other three-level converters, because the mean value of the ...