A sharp tip is essential for high resolution surface characterization images using atomic force microscope (AFM). We propose an analytical model for in-situ monitoring of AFM tip wear by tracking the ...

Photothermal AFM-IR offers detailed insights into polymer chemistry, aiding in the identification and quantification of ...

To characterize patterns of charges on electrets, Kelvin probe force microscopy (KFM) usually serves as a very useful tool to measure the electrostatic potential through an electric cycle; however, it ...

One of the major limitations for Atomic Force Microscopy (AFM)-based nanomanipulation is that AFM only has one sharp tip as the end-effector, and can only apply a point force to the nanoobject, which ...

Two-dimensional (2D) heterostructures hold significant promise in electronics and photonics. However, bubbles that spontaneously form at the interface between two crystals often degrade the ...