Engineered for versatility, the FX200 AFM combines automation and precision, streamlining large-sample imaging for both ...

This stacking arrangement, along with the thickness values for each of the three layers, is illustrated in Figure 2d. KPFM measurements provided the contact potential difference (V CPD) between the ...

Abstract: One of the major limitations for Atomic Force Microscopy (AFM)-based nanomanipulation is that AFM only has one sharp tip as the end-effector, and can only apply a point force to the ...

This study presents high-resolution electrochemical mapping of HOPG, revealing nanoscale variations in electrochemical activity across basal planes.

† Department of Chemical and Materials Engineering, University of Alberta, Edmonton, Alberta T6G 2V4, Canada ‡ Department of Mechanical Engineering, University of Alberta, Edmonton, Alberta T6G 2G8, ...

In this context, an atomic force microscopy tip was functionalized with concanavalin A to perform single-molecule force spectroscopy measurements on polystyrene brushes with thicknesses of 10 and 60 ...

Abstract: The purpose of our research is to tune two-dimensional (2D) slab photonic crystal (PhC) reflectors by inserting an AFM cantilever into one of the air holes. The 2D slab PhCs have ...