A sharp tip is essential for high resolution surface characterization images using atomic force microscope (AFM). We propose an analytical model for in-situ monitoring of AFM tip wear by tracking the ...

Photothermal AFM-IR offers detailed insights into polymer chemistry, aiding in the identification and quantification of ...

The lithography as a basic process determines properties of microelectronic device. The main area of investigation is the resolution of the lithography operation. The resolution of optical lithography ...

AFM-IR technology provides critical data on polymer compositions and properties, supporting the development of advanced ...