This makes AFM an essential tool for device design dependent on the stacking of 2D materials. Moreover, the AFM tip can be applied to manipulate samples at the nanoscale. Concerning graphene, it can, ...

Mechanical properties are critical for investigating 2D materials with AFM. Torsional resonance in TFM can disclose the frictional response between the AFM tip and the material, which is necessary ...

The technique, which works by quantifying the differences in the van der Waals radii of the atoms, could be used as a general way to analyse technologically important functionalized 2D carbon ... tip ...

Wrinkles are an inevitable structural deformation in 2D semiconductor ... Schematic diagram of adaptive TEPL (a-TEPL) spectroscopy based on shear-force AFM using bottom-illumination optics with a ...

(Nanowerk Spotlight) The foremost atom of the tip in a scanning probe microscope is critically ... "One potential direction for our field is the AFM observation of emerging 2D materials such as ...

Additionally, the capability to alter light-matter interaction at the AFM tip allowed for the incorporation of defects into the hBN surface. This manipulation of light-matter interaction offers a ...

These modes typically need a direct contact between the sample and the AFM tip. Traditionally, the resultant data has been in the form of a two-dimensional (2D) map, produced in contact mode, with one ...