The most common form of ESD damage is reportedly CDM. Although CDM is arguably the leading cause of ESD damage among electronic components, some semiconductors, including discrete components, are ...

The ESD-CDM test setup (top ... Each model has its own classification for categorizing devices according to their ESD sensitivity (see the tables). Sanjay Agarwal is a senior product engineer ...

CDM testing simulates ESD charging followed by a rapid discharge, similar to what is seen in the automated handling, manufacturing, and assembly of IC devices. Unfortunately, this test also gives ...

The most commonly used ESD test models are the Human Body Model (HBM) and the Charged Device Model (CDM). Both models assess the ESD sensitivity of a device, however due to the rapid growth in ...

The Calibre PERC checks include: ESD CDM verification confirming that the transistor gate is not connected directly to a PAD, ESD protection on the IO PAD, and power management propagation rules ...

The library provides ESD solutions from 500V to >8kV HBM; 3A to 12A CDM options targeting 250V to 750V CDM qualifications. Features also include low capacitance RF and SerDes ESD protection: generic ...